Showing results: 136 - 150 of 268 items found.
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32115 -
Parallax Inc.
On-chip debug (OCD) interfaces can provide chip-level control of a target device and are a primary vector used by engineers, researchers, and hackers to extract program code or data, modify memory contents, or affect device operation on-the-fly. JTAGulator is an open source hardware tool that assists in identifying OCD connections from test points, vias, or component pads on a target device.
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FS2601 -
FuturePlus Systems
The FS2601 is one of our newest and fastest logic analyzer probes used to test DDR5 memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 UDIMMs running above 4000MT/s.
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PXIe3110 -
VX Instruments GmbH
The PXIe3110 is the most compact andpowerful 3U one-slot embedded controller forthe PXI Express and CPCIexp platform. With itshuge and future-ready interface capabilities,it runs perfectly with most test and measurementapplications.The Controller is driven by a 7th generationIntel® Core™ processor combined with up to32 GB DDR4 memory and easily supports highbandwidth applications with its PCIe Gen3system and storage interconnectivity.
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AMIC-30 -
Amperis sl
The AMIC-30 insulation tester is a small portable meter designed to measure insulation resistance in electrical and telecommunications installations, cables, motors, transformers and other equipment. The test voltage can be programmed in steps from 10 V to 1000 V. The instrument can measure both insulation resistance over a wide range (0,1kΩ...100GΩ), and insulation leakage current, capacitance and other parameters. All test results can be stored in the internal memory and sent to a computer via the included wireless USB receiver. The meters are supplied with rechargeable Ni-Cd batteries.
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TOS3200 -
Kikusui Electronics Corp.
The Leakage Current Tester TOS3200 is designed to perform leakage current (touch current and protective conductor current) tests on general electrical equipment but not medical electrical equipment.It enables you to conduct tests that conform to the requirements of the applicable IEC, UL, JIS, and other standards, as well as the Electrical Appliance and Material Safety Law. The memory in the main unit stores the 51 types of test conditions laid down in the IEC/JIS standards for information technology equipment, household electrical appliances, audio, video electronic apparatus, luminaires, motor-operated electric tools, and electrical equipment for measurement and control and in the Electrical Appliance and Material Safety Law, thereby enabling you to conduct standard tests with simple panel operation.
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780319-02 -
NI
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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780319-03 -
NI
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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780319-01 -
NI
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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CTC Series -
AMETEK Sensors, Test & Calibration
CTC Series Compact Temperature Calibrator from AMETEK Sensors, Test & Calibrations is engineered for “advanced simplicity,” incorporating a number of useful features that greatly extend the range and functionality of the popular temperature calibrator. The CTC Series offers an easy-to-read, full-color display with improved navigation that provides easy access to the calibrator’s latest features. The CTC Series now contains an auto step function with up to 12 preset temperature points, an optimized switch test with automatic up and down test runs, assisted manual calibration using pre-defined temperature points, and memory to store up to 5 calibration processes.
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FOX-XP -
Aehr Test Systems
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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FireSpy430b(T)/830b(T) -
DapTechnology B.V.
The FireSpy430b(T) and FireSpy830(bT) bus analyzers are the single bus models in the 4th generation of IEEE-1394 analyzers from DapTechnology. Based on the industry leading FireSpy810 the all new and enhanced architecture of the FireSpy430b(T)/830b(T) have again defined a new reference in IEEE-1394 test equipment! They comprise a significantly more powerful on-board processor, more memory and improved connectivity to the host.
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HI-903 -
Metrix
This is our top of the line Hardy Shaker. It provides the ability to set the amplitude and change the frequency range without the amplitude changing. This automation makes conducting vibration tests easier. Tests can be conducted on multiple vibration transducers, and then the saved data can be transferred via USB Flash Drive to be displayed in an automated and customizable report using an Excel template on your computer. In manual mode, the vibration test level and test frequency can be set from 7 Hz to 10,000 Hz. The high accuracy instrument can display the vibration level in terms of g’s peak, velocity peak (in/sec or mm/s) or displacement peak-to-peak (mils or µm). The unit can support payloads up to 800 grams (see frequency limits in the manual). A built-in display reads the output sensitivity, which can be stored in memory. Complete testing sequences and data can be stored in memory for each tested sensor, the unit logs the data on the spot or stores it for later use. For testing of heavy transducers or at high frequencies, the HI-903 automatically corrects the sensitivity calculation for the effects of transducer mass loading. A built-in self-test program checks for accuracy of all calculations. The HI-903 has a built-in battery charger that can operate on 120 or 240 VAC. The unit comes in a rugged Pelican case.
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HMC8012 -
Rohde & Schwarz GmbH & Co. KG
True RMS measurement, AC, AC + DC Simultaneous display of three measurement functions, e.g. DC + AC + statistics Measurement functions: DCV, DCI, ACV, ACI, frequency, resistance (2- and 4-wire), temperature, capacitance, diode and continuity test Mathematic functions: limit testing, minimum, maximum, average, offset, DC power, calculation of dB and dBm Data logging to internal memory or USB stick
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FS2352B -
FuturePlus Systems
The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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GX5280 -
Terotest Systems Ltd.
The GX5280 Series are high performance, cost-effective 3U PXI dynamic digital I/O boards with 32 TTL input or output channels and 32 LVDS input or output channels. The GX5280 Series offers an industry leading 512 MB of on-board memory and supports test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
